Material research microscopes

Olympus BXFM

The BXFM is a reflected light microscope for metallurgy and materials applications.

The BXFM microscope concept brings together all the capabilities needed for thorough inspection of a wide variety of electronic devices and semiconductor components. As well as excellent cost-efficiency, it offers a compact design based on advanced ergo-nomics.

The comprehensive list of features includes top-quality UIS optics backed by a full range of accessories from Olympus as well as from Ryf AG , and an arm-inte-grated reflected light illuminator for easier component installation and greater overall system flexibility.

The BX41M-ESD is provided to protect electronic devices from potentially harmful static electricity, and to broaden the inspection field of this advanced, high-performance microscope.
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