Nikon Eclipse L200 / L200D

IC Inspection Microscopes

ECLIPSE L200 / L200D

With the adoption of Nikon’s highly acclaimed CFI60 optical system in the Eclipse L200 series, a new order of optical performance has been achieved. But Nikon didn’t stop there. They improved the ergonomic design of these microscopes and made them more resistant to vibrations. The result: a new standard for IC inspection microscopy for the 21st century. Used independently, or in combination with wafer loaders, the L200 series is designed to perform optical inspection of wafers, photo masks, reticles and other substrates with exceptional precision.