The SuperView WT Series is a hybrid 3D optical profilometer designed for sub-nanometer measurement of surfaces on various precision components and materials. It combines the performance features of two high-precision 3D measurement instruments – a white light interferometer and a confocal microscope – enabling non-contact surface scanning and the creation of detailed 3D surface images.

For ultra-smooth and transparent surfaces, the white light interferometry mode provides high-precision, distortion-free images and allows analysis of surface parameters such as roughness. For coarse surfaces with sharp-angle features, the confocal microscopy mode reconstructs large-angle 3D topography images. Subsequent data processing and analysis of the 3D surface images using specialized software yields a comprehensive set of 2D and 3D parameters reflecting surface quality.

The SuperView WT Series offers a flexible, precise, and versatile solution for research, quality control, and high-precision manufacturing applications where maximum accuracy and detail are essential.