Nikon JCM-6000Plus JEOL NeoScope Benchtop (obsolete)

With the JCM-6000's highly-regarded touch-panel operating environment, the JCM-6000Plus has been further enhanced with a high-sensitivity backscattered electron detector providing high quality images, achieving a high-end, high-performance benchtop scanning electron microscope that is entirely user-friendly.

• ”Easy” image acquisition
• High-vacuum mode and Low-vacuum mode provided as standard
• Element analysis
• Improved image quality
• Touch panel & Simple GUI

Electron microscope REM:

An electron microscope is a microscope that uses a beam of accelerated electrons as a source of illumination. As the wavelength of an electron can be up to 100,000 times shorter than that of visible light photons, electron microscopes have a higher resolving power than light microscopes and can reveal the structure of smaller objects. A transmission electron microscope can achieve better than 50 pm resolution and magnifications of up to about 10,000,000x whereas most light microscopes are limited by diffraction to about 200 nm resolution and useful magnifications below 2000x. Transmission electron microscopes use electrostatic and electromagnetic lenses to control the electron beam and focus it to form an image. These electron optical lenses are analogous to the glass lenses of an optical light microscope. Electron microscopes are used to investigate the ultrastructure of a wide range of biological and inorganic specimens including microorganisms, cells, large molecules, biopsy samples, metals, and crystals. Industrially, electron microscopes are often used for quality control and failure analysis. Modern electron microscopes produce electron micrographs using specialized digital cameras and frame grabbers to capture the image. Reflection electron microscope (REM): In the reflection electron microscope (REM) as in the TEM, an electron beam is incident on a surface but instead of using the transmission (TEM) or secondary electrons (SEM), the reflected beam of elastically scattered electrons is detected. This technique is typically coupled with reflection high energy electron diffraction (RHEED) and reflection high-energy loss spectroscopy (RHELS).