Nikon séries BW-S500 / BW-D500

Nikon's proprietary scanning-type optical interference measurement technology achievees 1pm* height resolution.

Quickly and accurately measures surface profile from sub-nano to millimeter height ranges, using a single measurement mode. Fully supports high-precision processing technology and advanced material development of the Materials Science field.

* Height resolution specified by algorithm

The BW-S500/BW-D500 series is calibrated by an 8 nm or 8 μm VLSI Step Height Standards sample, certified by the NIST. Achieves extremely high accuracy and repeatability as a height measurement system.