Visoria M Materialmikroskop
Visoria M Materialmikroskop
Visoria M Materialmikroskop
Visoria M Materialmikroskop

Product information

Leica Visoria M – The Efficient Materials Microscope for Routine and Analysis

Precision meets ergonomics: Optimize your material testing with the Leica Visoria M. Whether in metallography, electronics development, or quality assurance – this upright light microscope sets new standards in workflow efficiency and ease of use.

The Leica Visoria M was specifically developed for users who demand the highest optical quality while needing to complete daily routine tasks quickly and without errors. At Ryf AG, you receive this high-performance system including customized configuration and our first-class on-site service.

Highlights of the Leica Visoria M:

Intelligent Coding for Faster Results

Save valuable time during documentation. Thanks to fully coded functions (nosepiece, illumination, and contrast manager), the system automatically recognizes the selected settings.

  • Automatic Light Management: Brightness adjusts automatically when switching objectives.
  • Error-Free Calibration: Scale bars are immediately displayed correctly in the Enersight software – eliminating the need for manual entries.

Maximum Ergonomic Comfort

Long working days at the microscope can be strenuous. The Visoria M is designed to prevent fatigue:

  • Symmetrical Layout: Focus and stage controls are positioned to allow for a natural, relaxed posture.
  • Individual Customization: Use the wide range of ergo-tubes and ergo-modules to perfectly adjust the viewing height and angle to your needs.
  • One-Handed Operation: The design allows for the control of key functions with just one hand – easily adjustable for right- or left-handed users.

Versatile Contrast Methods for Every Material

Whether structures, defects, or impurities – with the Visoria M, no detail goes unnoticed. The system supports all common methods:

  • Brightfield & Darkfield
  • Polarization & DIC (Differential Interference Contrast)
  • Oblique Illumination: Ideal for visualizing surface topographies.
  • Fluorescence: For specialized material analysis.

Digital Efficiency with Enersight Software

In combination with the intuitive Enersight platform, the Visoria M becomes a digital powerhouse. Benefit from features such as:

  • Layer Thickness Measurement: Semi-automatic analysis of coatings.
  • EDOF (Extended Depth of Field): Create razor-sharp images of samples with significant height differences.
  • XY-Stitching: Combine multiple individual images into a high-resolution overview.

Technical Data at a Glance:

  • Nosepiece: 5-fold (M32) or 6-fold (M25) coded.
  • Focusing System: 3-stage (Coarse, Medium, Fine) for precise focusing at high magnifications.
  • Sample Space: Generous working distance and various stages (XY stages, rotary stages) available.
  • Safety: Integrated focus stop to protect the objective and sample, plus an antimicrobial surface coating.

Visoria M Materialmikroskop

Manufacturer: Leica
Product added to offer
Add to offer
Product removed from offer